Facilities

Thin Film Deposition by Atomic Layer Deposition

PV characterization of DSCs

Several work stations are equipped to cover a whole range of diagnostic measurements on the performance of photovoltaic devices.

These include the measurement of:

– The Current-Voltage characteristics under different simulated AM 1.5 Sun intensities.

– The Incident Photon to Charge Carrier Efficiency of the same devices.

– The photo transient Current & Voltage characteristics .

– Charge Extraction.

Stability Measurements

   

The LPI designed its own technology in order to perform high-throughput stability tests of solar cells.

These instruments allow for flexibility and control of the environment and achieve good reproducibility. Each measurement module can analyze 8 solar cells simultaneously. The modules (measurement and control) are interconnected via a network and can be controlled individually.

The light source is a LED array that can be controlled with high precision.

The measurements (a set of current-voltage curves at different light intensities) are made automatically several times per day.

Between measurements, cells are kept in a defined operating state, i.e. at open circuit voltage or at maximum power point tracking (MPPT). The cells are continuously illuminated during the stability test.

Responsible: Manuel Tschumi

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Le LPI a développé sa propre technologie afin d’effectuer en masse des tests de stabilité pour les cellules solaires.

Ces instruments permettent une grande flexibilité ainsi qu’une bonne reproductibilité.

Il s’agit de plusieurs modules en réseau pouvant chacun mesurer 8 cellules solaires simultanément.

Des sources de lumières à LED contrôlés avec une grande précision sont utilisées.

Les mesures (ensemble de courbes courant-potentiel à différentes intensité lumineuses) se font de manières périodiques et totalement automatisées.

Entre les mesures,  toutes les cellules sont maintenues dans un état électrique prédéfini (circuit ouvert, ou encore MPPT) et continuent à être illuminées pour poursuivre le teste de stabilité.

Personne responsable : Manuel Tschumi

Transistor Measurement

 

Vacuum Tool